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S-TEST Lab systems
S-TEST Lab DRE
S-TEST Lab DRE
The S-TEST Lab DRE system is based on the DRE-01 dynamic rotation exciter. A typical application here is the determination of the properties of MEMS sensors and sensor components in the development phase.
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S-TEST Lab ALF
S-TEST Lab ALF
The S-TEST Lab ALF systems can be setup with a wide range of low-frequency acceleration exciters. These shakers are available with an air bearing design for very precise motion or with robust ball bearing design for harsh testing conditions.
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S-TEST Lab AHF
S-TEST Lab AHF
Based on our high-frequency exciters SE-09 and SE-11, the S-TEST Lab AHF systems are a perfect fit for calibration and characterization of MEMS, digital sensors and other small components. Those typical systems were especially designed for system testing at high frequencies.
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S-TEST Lab VHF
S-TEST Lab VHF
The S-TEST Lab VHF system for sensor characterization in very high frequency is based on the SE-16 vibration exciter, which has been specially developed for high frequency excitation of small components and sensors both in the longitudinal and transverse direction.
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S-TEST Lab AMF
S-TEST Lab AMF
The S-TEST Lab AMF systems are based on the SPEKTRA vibration exciters such as the SE-10 or the SE-14, which have been especially developed for the excitation of DUTs and sensors in the medium frequency range.
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S-TEST Lab DPE
S-TEST Lab DPE
We have developed unique test equipment for pressure sensors that offers sine and shock excitation. An impulse with a max. pressure level of up to 420 MPa is introduced into your sensor. The pressure chamber can be adjusted and the DPE-02 can be configured as a vibration exciter, if required.
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S-TEST Lab APC
S-TEST Lab APC
The special design of the Piezocube makes it possible to introduce vibrations to a DUT at different mounting points or axes. This allows for controlled modal analysis – as is commonly required for high-frequency excitation of large DUTs (e.g. groups of several sensors).
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S-TEST Lab STS
S-TEST Lab STS
In sensor characterization, shock excitation helps test the robustness of a DUT. The shock excitation allows a very precise and controlled impulse to be applied to the DUT. The piezo exciter allows you to set the pulse length and amplitude independently within a certain range.
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SPEKTRA exciter systems cover a wide spectrum of physical stimuli, like translation, rotation, magnet field or pressure to enable stimulated testing and calibration of a large variety of different sensors. Besides a standard-compliant calibration of sensor devices these exciter sytems are also used in complete system level test setups that include stimulus and sensor system testing.
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Measuring systems and interface cards
The flexibility of the S-TEST system is achieved by powerful test electronics. The available measurement cards allow easy parallelization and enable high data throughput.
Exciters and components
SPEKTRA exciter systems cover a wide range of physical stimuli to enable stimulated testing and calibration of a large variety of different sensors.
Software
We provide product and test developers with a flexible software framework that enables fast development and adaptation of sensor system level tests.
Amplifiers
We have a selection of power amplifiers that offer protective functions suited to the respective exciter. They can be operated in voltage or current mode.
Options and accessories
The performance range of our systems can be extended at any time with optional components. It is thus possible to adapt a standard system to individual requirements at low cost.
Adapters and cables
For sensor calibration and other vibration-engineering applications, SPEKTRA offers a wide range of accessories for mechanical and electrical adaptation.