DT
VCS 40x
Flexibly configurable components, based on the powerful PXI system from National Instruments®. Drive of our exciters, from very low to very high frequencies: 10 mHz...500 kHz. Versatile applications allow very fast and effective production tests.
- PXI chassis from National Instruments® more information
- Very large frequency range (0.008 Hz...100 (1500) kHz)
- Anti-distortion mode (important for exciters APS-600, SE-10, DPE-01)
- 24-bit technology with wide dynamic range and low noise
- Individual and synchronized multichannel modes (1...10 control channels)
- Phase control for multichannel mode
- Spectral analysis, modal analysis
- Extensive functions for testing and research
- Remote control and system integration on multiple levels, digital interface
- Test scripts and multi-channel sensor measurement
- Real-time data acquisition and flawless recording
- 3-dimensional excitation modes
- Cutomizable database reports
- Laser support
- Distortion compensation
- Customized solution for quick production test
- XYZ multiplexer (3-direction testing)
- Interfaces for digital sensors
- Variable processor unit
- VCS 403: Quad core processor or higher.
High frequency and multi-channel applications, e.g. SE-09, SE-11, SE-16, 4*APS400 - VCS 401: dual core processor
Standard applications, e.g. APS 420, SE-10 - VCS 400: Atom processor
Low-cost solutions: Environmental test, production test
- VCS 403: Quad core processor or higher.
S-TEST Lab DPE
S-TEST Lab DPE
We have developed unique test equipment for pressure sensors that offers sine and shock excitation. An impulse with a max. pressure level of up to 420 MPa is introduced into your sensor. The pressure chamber can be adjusted and the DPE-02 can be configured as a vibration exciter, if required.
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S-TEST Lab AHF
S-TEST Lab AHF
Based on our high-frequency exciters SE-09 and SE-11, the S-TEST Lab AHF systems are a perfect fit for calibration and characterization of MEMS, digital sensors and other small components. Those typical systems were especially designed for system testing at high frequencies.
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S-TEST Lab AMF
S-TEST Lab AMF
The S-TEST Lab AMF systems are based on the SPEKTRA vibration exciters such as the SE-10 or the SE-14, which have been especially developed for the excitation of DUTs and sensors in the medium frequency range.
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S-TEST Lab DRE
S-TEST Lab DRE
The S-TEST Lab DRE system is based on the DRE-01 dynamic rotation exciter. A typical application here is the determination of the properties of MEMS sensors and sensor components in the development phase.
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Tel.: +49 351 400 24 0
Mail: sales@spektra-dresden.com