DT
S-TEST Lab ALF
The S-TEST Lab ALF systems can be setup with a wide range of low-frequency acceleration exciters. These shakers are available with an air bearing design for very precise motion or with robust ball bearing design for harsh testing conditions.
- Air bearing low-frequency exciters:
- APS 600: Frequency range up to 100 Hz
- APS 113-AB, APS 129, APS 500: Frequency range up to 200 Hz
- SE-13: Frequency range up to 400 Hz
- Ball bearing low-frequency exciters APS 113, APS 400 or APS 420
- Frequency range up to 200 Hz
- Max. force: 900 N
- Vertical and horizontal mode of operation
- Synchronous, well-tuned multi-exciter operation, multi-channel option
- 4 vibration modes
Software highlights
- Sine/noise 50 mHz…500 Hz
- Sweep, Dwell, manual mode, script operation and remote control
- Distortion factor measurement
- Spectral analysis and modal alanalysis
- Seamless sample recording
- Extensive display functions and charts
- Powerful filters
- Distortion compensation
APS 500
APS 500
Air-bearing ELECTRO-SEIS® Long Stroke vibration exciter with mounting table for payloads up to 3 kg. Especially developed for the calibration and testing of compact low frequency sensors and for sensor characterization at higher acceleration.
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APS 129
APS 129
Air-bearing ELECTRO-SEIS® Long Stroke Vibration Exciter with mounting table for high payloads up to 23 kg. Especially developed for the calibration and testing of big and heavy low frequency sensors as well as for sensor characterization (e.g. geophones or heavy seismic sensors).
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APS 600
APS 600
Air-bearing ELECTRO-SEIS® Long Stroke vibration exciter with mounting table for very high payloads. Especially developed for the calibration and testing of geophones and heavy seismic sensors.
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APS 113-AB
APS 113-AB
Air-bearing ELECTRO-SEIS® Long Stroke vibration exciter, especially developed for the calibration and testing for low frequency sensors and sensor charcterization.
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S-TEST/2
S-TEST/2
S-TEST/2 - Compact test system for digital sensors
Compact system level test solution (SLT) for sensors with digital interfaces. For use in development and testing or for quality assurance in the manufacturing process.
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VCS 40x
VCS 40x
Flexibly configurable components, based on the powerful PXI system from National Instruments®. Drive of our exciters, from very low to very high frequencies: 10 mHz...500 kHz. Versatile applications allow very fast and effective production tests.
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S-TEST Lab VHF
S-TEST Lab VHF
The S-TEST Lab VHF system for sensor characterization in very high frequency is based on the SE-16 vibration exciter, which has been specially developed for high frequency excitation of small components and sensors both in the longitudinal and transverse direction.
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S-TEST Lab AMF
S-TEST Lab AMF
The S-TEST Lab AMF systems are based on the SPEKTRA vibration exciters such as the SE-10 or the SE-14, which have been especially developed for the excitation of DUTs and sensors in the medium frequency range.
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S-TEST Lab AHF
S-TEST Lab AHF
Based on our high-frequency exciters SE-09 and SE-11, the S-TEST Lab AHF systems are a perfect fit for calibration and characterization of MEMS, digital sensors and other small components. Those typical systems were especially designed for system testing at high frequencies.
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