DT
S-TEST Lab AHF
Based on our high-frequency exciters SE-09 and SE-11, the S-TEST Lab AHF systems are a perfect fit for calibration and characterization of MEMS, digital sensors and other small components. Those typical systems were especially designed for system testing at high frequencies.
- Force rating 100 N
- Frequency range: SE-09: 3 Hz … 50 (95) kHz / SE-11: 1 kHz … 50 (95) kHz
- Sample rate 120/200 kS/s
- 24 Bit resolution
- SE-11 eligible for climate chamber
- Remote control for climate chamber
Software highlights
- Wide range of functions for R&D
- Sweep, Dwell, manual mode, script operation and remote control
- Spectral analysis and distortion factor measurement
- Supports laser vibrometer
- Spectral RMS measurement
- Extensive display functions
- Powerful filters
S-TEST/2
S-TEST/2
S-TEST/2 - Compact test system for digital sensors
Compact system level test solution (SLT) for sensors with digital interfaces. For use in development and testing or for quality assurance in the manufacturing process.
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VCS 40x
VCS 40x
Flexibly configurable components, based on the powerful PXI system from National Instruments®. Drive of our exciters, from very low to very high frequencies: 10 mHz...500 kHz. Versatile applications allow very fast and effective production tests.
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S-TEST Lab AMF
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S-TEST Lab VHF
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