DT
S-TEST Lab APC
The special design of the Piezocube makes it possible to introduce vibrations to a DUT at different mounting points or axes. This allows for controlled modal analysis – as is commonly required for high-frequency excitation of large DUTs (e.g. groups of several sensors).
PC-01 for single-axis or PC-X for multi-axis excitation
- High-performance ceramic block with piezoelectric actuator
- Frequency range: 5 kHz...40 kHz
- Acceleration: 300 m/s²
- Sample rate 200 kS/s
- Low weight and high stiffness offer high resonance frequencies
- Complex 3D field data replication or simultaneous sine/noise excitation in XYZ requires a complex setup with 9 amplifiers and a 9-channel VCS.
Software highlights
- Sine/noise 0,1 Hz...95 kHz
- Multiple functions for R&D
- Sweep, dwell, manual mode, script operation and remote control
- Spectral analysis
- 3D replication with lateral vibration compensation
S-TEST/2
S-TEST/2
S-TEST/2 - Compact test system for digital sensors
Compact system level test solution (SLT) for sensors with digital interfaces. For use in development and testing or for quality assurance in the manufacturing process.
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VCS 40x
VCS 40x
Flexibly configurable components, based on the powerful PXI system from National Instruments®. Drive of our exciters, from very low to very high frequencies: 10 mHz...500 kHz. Versatile applications allow very fast and effective production tests.
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