DT
S-TEST Lab DRE
The S-TEST Lab DRE system is based on the DRE-01 dynamic rotation exciter. A typical application here is the determination of the properties of MEMS sensors and sensor components in the development phase.
- Electro-dynamic drive
- Frequency range: 1 Hz…5 kHz
- Very low cross-acceleration
- Max. payload: 500 g
- Max. angular velocity: 5300 °/s
- Max. angular acceleration: 2,5 · 106 °/s2
- Distortion factor (angular velocity): < 3%
DRE-01
DRE-01
The DRE-01 dynamic rotation exciter is used for calibration of gyro transducers (angular velocity/acceleration) and for characterization of MEMS sensors. It features very low motion distortion, built-in overload protection and cooling for improved performance, and can be operated with any signal generator or vibration controller.
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S-TEST/2
S-TEST/2
S-TEST/2 - Compact test system for digital sensors
Compact system level test solution (SLT) for sensors with digital interfaces. For use in development and testing or for quality assurance in the manufacturing process.
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VCS 40x
VCS 40x
Flexibly configurable components, based on the powerful PXI system from National Instruments®. Drive of our exciters, from very low to very high frequencies: 10 mHz...500 kHz. Versatile applications allow very fast and effective production tests.
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