DT
S-TEST Engineering Board
Versatile platform for SPEKTRA S-TEST with a freely usable prototyping area for small digital sensors. To prepare required circuitry and/or components for sensor prototype bring-up and sensor test development.
Downloads:
Applications
- Sensor prototype bring-up
- Sensor test development
- Interface signal analysis
Selected Data
- Double-layer PCB
- Compact dimensions: 120 x 140 mm
Features
- 64-pin S-TEST(BSI) interface
- Free usable prototyping areas
- Sensor connect area for up to 64 pin sensors (7,62 mm / 15,24 mm)
- ZIF connect area for flexible PCB 1mm pitch sensor interfaces
- 2-pin headers for each signal (connect and measure)
S-TEST/2
S-TEST/2
S-TEST/2 - Compact test system for digital sensors
Compact system level test solution (SLT) for sensors with digital interfaces. For use in development and testing or for quality assurance in the manufacturing process.
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S-TEST/16 Fab
S-TEST/16 Fab
S-TEST/16 Fab – Production test system for digital sensors
Compact system level test solution (SLT) for sensors with digital interfaces. Typical fields of application are mass production tests of sensors and quality assurance in sensor production.
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S-TEST/16 Lab
S-TEST/16 Lab
S-TEST/16 Lab - Efficient measurement system for digital sensors
Compact system level test solution (SLT) for sensors with digital interfaces. Development and testing of sensors or quality assurance in sensor manufacturing.
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Tel.: +49 351 400 24 0
Mail: sales@spektra-dresden.com