DT
S-TEST UTB (BSI) - Universal Tester Board
Universally applicable board for efficient System Level Test (SLT) of digital sensors, sensor characterization testing or final tests in sensor mass production.
Downloads:
Selected Data
- Supply voltage range: −2 V…+20 (25)1) V
- Supply current: up to ±50 (20)1) mA/source
- 12.5 ns timing resolution
- Slew Rate Control (1 V/μs…8.3 V/ms)
Features
- Fast FPGA for FW and host interface IP cores
- Support for SPI, I²C, JTAG, SENT, PSI5, CAN‑FD2), LIN, ZACwire™
- 16 freely programmable IO pins
- 4 independent power sources
- External trigger functionality
- Fast LVDS backplane interface
- Special Function interface for custom hardware extension
S-TEST/16 Lab
S-TEST/16 Lab
S-TEST/16 Lab - Efficient measurement system for digital sensors
Compact system level test solution (SLT) for sensors with digital interfaces. Development and testing of sensors or quality assurance in sensor manufacturing.
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S-TEST/16 Fab
S-TEST/16 Fab
S-TEST/16 Fab – Production test system for digital sensors
Compact system level test solution (SLT) for sensors with digital interfaces. Typical fields of application are mass production tests of sensors and quality assurance in sensor production.
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S-TEST/2
S-TEST/2
S-TEST/2 - Compact test system for digital sensors
Compact system level test solution (SLT) for sensors with digital interfaces. For use in development and testing or for quality assurance in the manufacturing process.
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