DT
S-TEST - Chassis Controller Board
Interface board for S-TEST system solutions
Communication
- TCP control & command
- 3 x USB for Configuration and Maintenance
- DDS-module for clock generation e.g. for SPI
- 36 LVDS Lines for internal UTB communication
Digital Front-End
- 2 x Trigger Input
- 2 x Digital Output
- 5 V Supply Voltage
- Calibration Lines for Voltage and Resistance
S-TEST Logic & FW Updates
- Easy exchange of interface logic blocks
S-TEST Chassis Self Calibration
- Highly stable reference voltage source
- Precision reference resistors
S-TEST/16 Lab
S-TEST/16 Lab
S-TEST/16 Lab - Efficient measurement system for digital sensors
Compact system level test solution (SLT) for sensors with digital interfaces. Development and testing of sensors or quality assurance in sensor manufacturing.
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S-TEST/2
S-TEST/2
S-TEST/2 - Compact test system for digital sensors
Compact system level test solution (SLT) for sensors with digital interfaces. For use in development and testing or for quality assurance in the manufacturing process.
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S-TEST/2m
S-TEST/2m
BSI-SIRm-2+
For the measurement of electrical properties of and communication with MEMS sensors.
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S-TEST/16 Fab
S-TEST/16 Fab
S-TEST/16 Fab – Production test system for digital sensors
Compact system level test solution (SLT) for sensors with digital interfaces. Typical fields of application are mass production tests of sensors and quality assurance in sensor production.
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