Developer training S-TEST (BSI)

Sensor testing in lab conditions by SPEKTRA

For whom? Test engineers/test developers, SPEKTRA S-TEST users and operators

What is it about? Based on the SPEKTRA S-TEST systems, the attendees will learn more about the hardware and software and how to use the system. Focus is placed on the efficient test sequence programming to support test and measurement tasks on typical sensors.

What will you learn? After an overview about the basic sensor system level testing (SLT) and sensor characterization concepts, the attendees get further details about the S-TEST hardware architecture, the various components and the internal building blocks. The specifics of the embedded NIOS processor and the NIOS sequence editor as basic development IDE will be explained. In the final theoretical part, we will introduce the basic test concepts and the software API of the S-TEST system.

In a more practical part, the TCP and NIOS software API will be used by the attendees in selected exercises that simulate typical sensor test scenarios.

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Seminar details

Dates & options

Upon request this training can be held at the SPEKTRA headquarters in Dresden, Germany or can be offered as on-site training – customized to the needs and requirements of your developer.

Enquire now!

Seminar management

SPEKTRA Schwingungstechnik und Akustik GmbH Dresden
Heidelberger Str. 12
DE - 01189 Dresden

Tel.: +49 351 400 24 0
Fax: +49 351 400 24 99
E-Mail:

Seminar content

Theoretical part

  • Basics of device characterization
  • Introduction of the S-TEST (BSI) hardware, including architecture and selected components
  • Introduction to TCP and NIOS software API
  • TCP and NIOS test flow and programming
  • Detailed NIOS test programming

Practical part

  • Introduction of the training hardware and the S-TEST system tools
  • Practical use of the NIOS sequence editor
  • Test partitioning concepts
  • Practice on evaluation board
  • Analysis of selected test tasks
  • Q&A session

What will you learn?

Introduction into sensor system level testing (SLT)

  • Device characterization and test
  • SPEKTRA S-TEST Lab and Fab systems
  • System level testing concept (SLT)

The S-TEST (BSI) hardware

  • Typical configurations
  • Hardware architecture and components
  • Sensor interfaces and the NIOS processor

The S-TEST Software

  • Programming via TCP
  • Programming via NIOS
  • NIOS sequence editor
  • NIOS programming details

Conditions

Service scope

  • Participation in theoretical and practical part for 1 person
  • Seminar documentation
  • Catering during breaks
  • 2 x lunch

Attendance fee: 1,150 euros

Participation and cancellation conditions

  1. We reserve the right to cancel the seminar if there are not enough participants.
  2. It is possible to withdraw from the event free of charge up to 21 days before the start of the seminar.
  3. A cancellation fee of 50 % will be charged from 20 days to 8 days before the start of the seminar.
  4. If cancellation takes place 7 days up to 1 day before the start of the seminar or in the event of non-participation, seminar fees shall be due in full.
  5. The date of withdrawal is the date of receipt of the mail. Participants may be changed free of charge.
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