SPEKTRA – your partner for quality assurance in research, development and production.
Quality-oriented enterprises incorporate environmental testing of a product into their activities already at the planning stage of product development with the aim of overall cost optimization.Automotive sub-suppliers, manufacturers of electronic modules, sensors and measurement and test instrumentation utilize our competence and broad spectrum of services.
We are flexible in meeting your deadlines. Different tests can be performed in parallel and additional requirements such as monitoring of functions during a test can be met.Tests that are outside the scope of our own facilities can be carried out by our cooperation partners in coordination with our customers.
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Overview of environmental simulation
Mechanical tests (e. g. according to DIN EN 60068 or factory standards)
Vibration tests
Sinusoidal, resonance search
Noise
Shock exposure / tests
Extreme shock tests of small and light-weight sensors and modules (max. weight 30 gram) with up to 100,000 gn
Climatic tests (e. g. according to DIN EN 60068 or factory standards)
Cold
Dry heat
Moist heat, constant
Moist heat, varying in cycles
Temperature shock
The effective volume of our climatic chambers is 600 litres with the following dimensions in mm: 800 x 800 x 950.
Temperature range of constant and cycled tests: -70 °C ... +180 °C
Change of temperature: 10 K/min
Range of relative humidity: 10 % ... 95 %
Range for temperature shocks (in cooperation): -80 °C ... +200 °C
Combined mechanical / climatic tests (e. g. according to DIN EN 60068)
Vibration tests (sinusoidal, noise, shock) in combination with temperature stress (heat, cold, thermostream)
Complete environmental tests
Monitoring / recording of digital and analog signals
With our monitoring software "Observer", both digital and analog output signals of DUTs with a sampling frequency of up to 2 MHz can be monitored. The software has been specially programmed for this monitoring and can also be adapted to the special requirements of customers if necessary.
Via an A/D converter, voltages up to 10 V (higher voltages via voltage divider) can be digitized. With the help of suitable converters, other measured variables such as current consumption can be monitored.
Up to 16 channels are available for the monitoring of DUTs. Due to the high sampling rate, deviations in the μs range can be detected. The software records and stores the data or a certain interval is recorded in a ring buffer. Limit values can be defined for the monitored channels. If these values are exceeded or undercut, the recording of the ring buffer is saved directly (ASCII).
Practice example
Shock test for sliding contacts
The sliding contacts of a device under test should be examined for contact bouncing during a shock test. For this purpose, the output signal (behind the sliding contacts) was decoupled, digitized and recorded with a sampling rate of 20 kHz in the ring buffer with a capacity of one second. This finely graduated sampling rate allowed detection of the shortest interruptions of the output voltage in the microsecond range.
Output voltages of test devices
In another example, the output voltages of test devices were monitored during various shock tests. Again, the output signal was decoupled with a voltage divider, digitized by an A/D converter, and recorded with a sampling rate of 50 microseconds in the ring buffer. When the conditions for the predetermined tolerance range (adjustable limit areas that can be programmed with the software) were satisfied, the recorded data of the ring buffer was automatically stored.
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With SPEKTRA acting as a general contractor (in cooperation)
If no product or factory standards for mechanical and climatic environmental tests are available, do not hesitate to ask our experts about the severity and practical carrying-out of the tests. A test report will be drawn up stating the test result and including a documentation of the test run with figures.
Picture: View into the climate chamber with the SE-10, a vibration exciter from SPEKTRA, on which a test sensor is mounted.
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